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Trend curve development for surveillance data with insight on flux effects at high fluence: damage mechanisms and modeling
Trend curve development for surveillance data with insight on flux effects at high fluence: damage mechanisms and modeling
Workshop: November 19-21, 2008
Registration fee
The number of participants will be limited to 35 participants
Participation fee:
Prior to September 30: 250 EUR
After September 30: 350 EUR
Participation fee includes:
Registration
Reception
Meals
Breaks
Workshop dinner
Abstracts booklet

